Learn about our COVID-19 response    ->

Material Testing Lab | Innovatech Labs

Material Testing Labs Innovator

  • Request Quote

888-740-5227 Email

Menu
  • Material Testing Methods / Techniques
    • Auger Electron Spectroscopy (AES)
    • Differential Scanning Calorimetry (DSC) to Measure Heat Flow
    • Fourier Transform Infrared Spectroscopy (FTIR)
    • Gas Chromatography Mass Spectrometry (GC/MS)
    • Ion Chromatography (IC)
    • Light Microscopy & Imaging
    • Liquid Particle Counting (LPC)
    • Electron Spectroscopy for Chemical Analysis (ESCA)
    • Melt Flow Testing
    • Scanning Electron Microscopy (SEM)
    • Thermal Gravitational Analysis (TGA) Lab Services
    • Close
  • Analytical Services
    • Cleanliness Testing for Microcontamination
    • Failure Analysis Testing Services
    • Material Testing Services for Products and Components
    • Materials Characterization & Specialized Testing
    • Outgassing Testing Services Prevents Critical Errors
    • Quality Control Testing for Manufactured Products
    • Close
  • Industries
    • Hard Drive Microcontamination Testing Services
    • Manufacturing Support
    • Critical Medical Device Testing Services
    • Close
  • About
    • Sample Submission Form: Download
    • Professional Services / Consulting
      • Metallurgical Consulting
      • Short Courses
      • Technical Presentations
      • Close
    • Testimonials
    • Close
  • Case Studies
  • Newsroom
You are here: Home / Comparison of Two Scanning Electron Microscopy Systems: VPSEM & FESEM

Comparison of Two Scanning Electron Microscopy Systems: VPSEM & FESEM

Two types of scanning electron microscopy (SEM) systems are available through Innovatech Labs – Variable Pressure SEM (VPSEM) and Field Emission SEM (FESEM). Having access to both systems allows us to meet the demands of the most challenging projects in materials characterization and failure analysis. The table below compares SEM applications for each of the systems.

SEM APPLICATIONCONVENTIONAL SEMVARIABLE PRESSURE SEM (VPSEM)SEM (FESEM)
Metal FracturesLow to moderate magnification examination for mechanism and material anomaliesHigh resolution imaging for very fine features, such as sub-micron fatigue striations
Polymer FracturesImaging of fine fracture features with coatingEvaluation of general fracture features without coatingImaging of fine fracture features using low voltage (uncoated) or higher voltage with coating
SemiconductorsExaminations at moderate magnifications (20,000X) and microanalysis of phases and features -usually coatingExaminations at moderate magnifications (20,000X) and microanalysis of phases and features without coatingHigh resolution imaging of very fine features and phases with microanalysis
MicrostructuresImaging and microanalysis of conductive materials without coatingImaging and microanalysis of conductive or nonconductive materials without coatingHigh resolution imaging of very fine features and phases with microanalysis
Foreign MaterialImaging and microanalysis of conductive materials uncoated or nonconductive materials with coatingImaging and microanalysis of conductive or nonconductive materials without coatingMicroanalysis on conductive samples only or with carbon coating
Biological MaterialsImaging possible after drying and coatingBackscattered imaging without coating - some examination of "wet" samples is possibleHigh resolution imaging after drying and coating

Innovatech Labs, LLC

13805 1st Ave N, Ste 100
Plymouth, MN 55441
888-740-5227
info@innovatechlabs.com

  • Material Testing Lab [Home]
  • Case Studies
  • Request A Quote
  • Terms of Service
  • FTIR Analysis
  • GC/MS Analysis
  • TGA Analysis
  • Newsroom
  • Email
  • Facebook
  • LinkedIn
CompliAssure Secured Logo

© 2021 · Innovatech Labs, LLC