Innovatech Labs is a contract material testing lab specializing in materials characterization. Our rapid turnaround times ensure prompt shipment of your product and eliminate lengthy downtimes waiting for lab results. More
Materials Characterization
Testing for contaminants either on your product or on incoming supply, and reverse engineering are all accomplished with our wide range of analytical techniques such as FTIR analysis, GC/MS analysis, ion chromatography, ESCA, Auger and Liquid Particle Counting. More
Quality Control
Innovatech Labs can help maintain and resolve quality control issues. From cleanliness to staining, materials analysis techniques can help identify and answer questions regarding quality control issues. More
Cleanliness Testing
Demonstrate your dedication to the quality of your products with cleanliness testing from Innovatech Labs. Cleanliness testing is critical to suppliers in the biomedical device, computer hard drive and other critical environment industries. We are correlated to perform materials analysis and testing for computer hard drive manufacturers. More
Failure Analysis
Delaminating layers, products breaking when they shouldn't, discolored surfaces, strange odors, corrosion issues and more. Sound familiar? Submit a product or sample today and identify the cause of product failure. More
Professional Services
Many analytical laboratories perform only routine materials characterization and testing per specified methods, but Innovatech Labs specializes in unique materials analysis. Our analysts work directly with our customers to determine which analytical technique(s) will obtain the data necessary to solve the problem at hand. More
Newsroom
How X-Ray Photoelectron Spectroscopy/ESCA Works
X-Ray Photoelectron Spectroscopy (XPS), also referred to as Electron Spectroscopy for Chemical Analysis (ESCA) is a surface analysis technique that provides quantitative and chemical state information about a sample material’s surfaces and interfaces. XPS is an incredibly flexible, sensitive, and … [Read More...]
How Auger Electron Spectroscopy (AES) Works
In searching for surface testing for your conductive or semi-conductive product or device, you, no doubt, have come across the terms: AES Analysis, Auger Analysis, and Auger Microscopy. Each of these terms refers to Auger Electron spectroscopy, one … [Read More...]
Using Differential Scanning Calorimetry (DSC) to Identify Source of Epoxy Failures
Flexibility can be an asset — but not for a substrate used in the manufacture of an extremely sensitive electromechanical (EM) device. Typically used in industrial machinery, medical devices, and consumer products, EM devices include mechanical … [Read More...]
The Advantages and Disadvantages of Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) is a powerful materials analysis technique. It’s uniquely designed to capture compelling, high-resolution images of a sample’s surfaces. In fact, depending on the sample, we dare say the resulting photos often verge … [Read More...]
