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Innovatech Labs, LLC 13805 First Ave. N. Suite 100 Plymouth, MN 55441 Phone (763) 231-0150 Fax (763) 231-0151 Toll free: (888) 740-5227 |
Manufacturing Support Through Electron Spectroscopy for Chemical AnalysisInnovatech Labs provides manufacturing support by determining the quality of the passivation layer by measuring the chromium to iron ratios by electron spectroscopy for chemical analysis (ESCA or XPS). In industries utilizing stainless steel in manufacturing or manufacturing processes, it is often critical to obtain a chromium oxide rich layer on the surface of the stainless steel to prevent rusting. Innovatech Labs provides manufacturing support by determining the quality of this passivation layer by measuring the chromium to iron ratios by electron spectroscopy for chemical analysis (ESCA or XPS). Below we have outlined a typical analysis of the passivation layer on stainless steel by ESCA. Measuring the passivation layer on stainless steel is just one of the many materials analysis applications provided by Innovatech Labs to help our customers maintain high quality in their manufacturing processes. Contact Innovatech Labs to discuss your specific analytical needs. Passivated Stainless SteelTechnique Used: ESCA (also known as XPS) The surface chemistry and thickness of stainless steel passivation layers (usually chromium oxide) can be measured using Electron Spectroscopy for Chemical Analysis The advantage of ESCA is it can provide not only a quantitative measurement of any surface impurities in the oxide layer, but information on the oxidation state of chromium and iron as well. The oxidation of chromium and iron are of prime concern in the passivation of stainless steel to prevent the formation of rust. The example below shows an high resolution scan of chromium (Cr 2p3/2, top left) and iron (Fe 2p3/2, top right) regions as well as a sputter depth profile of the passivation layer. The ESCA sputter depth profile (bottom figure) of the passivation layer shows its thickness to be approximately 20 angstroms.
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