Materials Characterization: Electron Spectroscopy for Chemical Analysis (ESCA)

Electron Spectroscopy for Chemical Analysis (ESCA, also known as XPS) is just one of the many materials characterization techniques available at Innovatech Labs.  ESCA is a surface analytical technique which provides information about surfaces and interfaces.

Electron spectroscopy for chemical analysis (ESCA, also known as x-ray photoelectron spectroscopy or XPS) is a surface analysis technique used for obtaining chemical information about the surfaces of solid materials. The materials characterization method utilizes an x-ray beam to excite a solid sample resulting in the emission of photoelectrons. An energy analysis of these photoelectrons provides both elemental and chemical bonding information about a sample surface.  The relatively low kinetic energy of the photoelectrons gives ESCA a sampling depth of approximately 30 Å.  ESCA can detect all elements from lithium to uranium with detection limits of ca. 0.1 atomic percent.  The principal advantage of ESCA is its ability to look at a broad range of materials (polymers, glasses, fibers, metals, semi-conductors, paper, etc.)  and to identify surface constituents as well as their chemical state.

Learn more about Electron Spectroscopy for Chemical Analysis or call us today to discuss your analytical lab service needs with one of our highly trained analysts 888-740-LABS (5227).