Electron Spectroscopy for Chemical Analysis (ESCA)

Electron spectroscopy for chemical analysis (ESCA, also known as x-ray photoelectron spectroscopy or XPS) is a surface analysis technique used for obtaining chemical information about the surfaces of solid materials. The method utilizes an x-ray beam to excite a solid sample resulting in the emission of photoelectrons. An energy analysis of these photoelectrons provides both elemental and chemical bonding information about a sample surface.  The relatively low kinetic energy of the photoelectrons gives ESCA a sampling depth of approximately 30 Å.  ESCA can detect all elements from lithium to uranium with detection limits of ca. 0.1 atomic percent.  The principal advantage of ESCA is its ability to look at a broad range of materials (polymers, glasses, fibers, metals, semi-conductors, paper, etc.)  and to identify surface constituents as well as their chemical state.

Details of Electron Spectroscopy for Chemical Analysis

Analysis of Contaminant on Polyethylene Surface

Analysis of Passivated Stainless Steel

Analysis of Haze on Polyimide Substrate

• Identify Elements present on a 

  surface

• Determine atomic concentrations

  of elements present and their

  binding energies.  Binding energies

  can help identify compounds

  present

• Measure distribution of elements

  present as a function of depth

Contact us for more information.

Home | About Us | Directions | Contact | Analytical Services | Professional Services
Applications | Client Comments | Manufacturing Support | Cleanliness Testing
Materials Characterization | Failure Analysis | Quality Control | Resources

© 2007 Innovatech Labs, Inc. All Rights Reserved.