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home > analytical services > sem/eds scanning electron microscopy - energy dispersive spectroscopy>VPSEM FESEM Comparison
Comparisons of Applications Using VPSEM & FESEM
Two types of scanning electron microscopes (SEM) are available through Innovatech Labs - Variable Pressure SEM and Field Emission SEM. Having access to both systems allows us to meet the demands of the most challenging projects in materials characterization and failure analysis. The table below compares apllications for each of the systems.
| APPLICATION |
VARIABLE PRESSURE SEM |
FIELD EMISSION
SEM |
| Metal Fractures |
Low to moderate magnification examination for mechanism and material anomalies |
High resolution imaging for very fine features, such as sub-micron fatigue striations |
| Polymer Fractures |
Evaluation of general fracture features without coating |
Imaging of fine fracture features using low voltage (uncoated) or higher voltage with coating |
| Semiconductors |
Examinations at moderate magnifications (20,000X) and microanalysis of phases and features without coating |
High resolution imaging of very fine features and phases with microanalysis |
| Microstructures |
Imaging and microanalysis of conductive or nonconductive materials without coating |
High resolution imaging of very fine features and phases with microanalysis |
| Foreign Material |
Imaging and microanalysis of conductive or nonconductive materials without coating |
Microanalysis on conductive samples only or with carbon coating |
| Biological Materials |
Backscattered imaging without coating - some examination of "wet" samples is possible |
High resolution imaging after drying and coating |
Innovatech Labs offers a broad range of cleanliness testing, surface analytical techniques, organic spectroscopies, bulk testing methods, and consulting services. Contact us for more information. |
