Comparisons of Applications Using VPSEM & FESEM

Two types of scanning electron microscopes (SEM) are available through Innovatech Labs - Variable Pressure SEM and Field Emission SEM. Having access to both systems allows us to meet the demands of the most challenging projects in materials characterization and failure analysis. The table below compares apllications for each of the systems.

APPLICATION	VARIABLE PRESSURE SEM	FIELD EMISSION SEM
Metal Fractures	Low to moderate magnification examination for mechanism and material anomalies	High resolution imaging for very fine features, such as sub-micron fatigue striations
Polymer Fractures	Evaluation of general fracture features without coating	Imaging of fine fracture features using low voltage (uncoated) or higher voltage with coating
Semiconductors	Examinations at moderate magnifications (20,000X) and microanalysis of phases and features without coating	High resolution imaging of very fine features and phases with microanalysis
Microstructures	Imaging and microanalysis of conductive or nonconductive materials without coating	High resolution imaging of very fine features and phases with microanalysis
Foreign Material	Imaging and microanalysis of conductive or nonconductive materials without coating	Microanalysis on conductive samples only or with carbon coating
Biological Materials	Backscattered imaging without coating - some examination of "wet" samples is possible	High resolution imaging after drying and coating