InnovaTECH - Materials Analysis Cleanliness Testing
Cleanliness Testing
Materials Analysis
Materials Analysis
Failure Testing
Failure Testing

Comparisons of Applications Using VPSEM & FESEM

Two types of scanning electron microscopes (SEM) are available through Innovatech Labs - Variable Pressure SEM and Field Emission SEM.  Having access to both systems allows us to meet the demands of the most challenging projects in materials characterization and failure analysis.  The table below compares apllications for each of the systems.

 

APPLICATION VARIABLE PRESSURE SEM

FIELD EMISSION

SEM

Metal Fractures
Low to moderate magnification examination for mechanism and material anomalies
High resolution imaging for very fine features, such as sub-micron fatigue striations
Polymer Fractures
Evaluation of general fracture features without coating
Imaging of fine fracture features using low voltage (uncoated) or higher voltage with coating
Semiconductors
Examinations at moderate magnifications (20,000X) and microanalysis of phases and features without coating
High resolution imaging of very fine features and phases with microanalysis
Microstructures
Imaging and microanalysis of conductive or nonconductive materials without coating
High resolution imaging of very fine features and phases with microanalysis
Foreign Material
Imaging and microanalysis of conductive or nonconductive materials without coating
Microanalysis on conductive samples only or with carbon coating
Biological Materials
Backscattered imaging without coating - some examination of "wet" samples is possible
High resolution imaging after drying and coating